Mitutoyo 378-834-7 BD Plan Apo 20X Objective for bright/dark-field observation in visible range

The BD Plan Apo 20X is a high-quality plan apochromat objective designed for both bright field and dark field inspection. It is ideally suited for identifying scratches, concavity, convexity, and fine surface irregularities, delivering excellent contrast and clarity for precision surface analysis.

With an infinity-corrected optical design and correction across the visible wavelength range (436–656 nm), this objective ensures sharp, flat-field imaging in both bright and dark field modes. The 20 mm working distance provides practical clearance while maintaining strong optical performance for mid-range magnification inspection tasks.

Featuring a numerical aperture of 0.42 and a resolving power of 0.7 µm, the BD Plan Apo 20X delivers detailed and reliable imaging performance. It is fully compatible with MF-U and Hyper MF-U microscope systems, making it a dependable choice for industrial and laboratory inspection environments.

Key Features

Suitable for Bright Field and Dark Field inspection

Ideal for detecting scratches, concavity, convexity, and fine surface defects

High-quality Plan Apochromat optical design

Infinity corrected

Long working distance design

Optimised for visible wavelength range (436–656 nm)

Specifications

Model: BD Plan Apo 20X

Magnification: 20x

Working distance (in air): 20 mm

Numerical Aperture (N.A.): 0.42

Corrected wavelength range: 436–656 nm

Resolving power: 0.7 µm

Depth of field: 1.6 µm

Field of view (ø24 mm eyepiece): ø1.2 mm

Field of view (1/2” camera chip): 0.24 × 0.32 mm

Spectral range: VIS

Observation mode: Brightfield / Darkfield

Glass compensation: No

Laser applications: No

Mass: 400 g